ON Semiconductor Launches Hyperlux ID Series Depth Sensors

ON Semiconductor recently announced the launch of its first real-time, indirect time-of-flight (iToF) sensor, the Hyperlux ID series, which can perform high-precision long-distance measurement and three-dimensional imaging of fast-moving objects.

The Hyperlux ID series uses ON Semiconductor's new proprietary global shutter pixel architecture and has its own storage. It can capture the entire scene while performing depth measurement in real time, achieving depth perception up to 30 meters, which is four times that of standard iToF sensors, and in a smaller form factor. The sensor series can also generate black and white images and depth information simultaneously. By combining these two outputs, the sensor series can provide a comprehensive view of the environment without the need to configure sensors for vision and depth data separately.

The Hyperlux ID series includes 1.2 million pixel global shutter, 3.5µm back-illuminated pixel sensors. The AF0130 model also comes with its own processing function, making integration simpler and reducing system costs. Customers who want to integrate their own depth detection algorithms can choose the AF0131, adding greater flexibility to the system. This series is suitable for a wide range of industrial environments, such as automation and robotics, manufacturing and quality control, logistics and material handling, agriculture and planting, access control systems, etc.